Lightweight CNN-Based Framework for Industrial Surface Defect Classification

Authors

DOI:

https://doi.org/10.25195/ijci.v52i1.769

Keywords:

ndustrial Surface Defect Classification, Convolutional Neural Networks (CNN), Deep Learning, , Hyperparameter Tuning, Grad-CAM

Abstract

Industrial surface defect classification is an important part of automated quality inspection systems. For these systems to work, they need to be able to detect surface defects accurately and efficiently to improve product reliability and reduce manufacturing costs. Traditional manual inspection methods are often time-consuming, subjective, and not suitable for fast-paced industrial environments. This study proposes a lightweight convolutional neural network (CNN)-based system for classifying industrial surface defects. The model was made to work well for classification and still be fast enough for real-world use. Keras Tuner was used in the proposed method to find the best hyperparameters. The proposed model was evaluated on the Northeastern University (NEU) Surface Defect Database using 5-fold stratified cross-validation. The results obtained from the experiments are promising since the system yields stable performance on all folds with accuracy scores of 99.72%, 99.17%, 100.00%, 99.17%, and 98.61% respectively. The mean accuracy score is calculated as 99.33%. Also, Grad-CAM visualization revealed that the network focuses on defective regions when processing an input image which supports the reliability and interpretability of the classification process.

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Author Biographies

Ahmeed Suliman Farhan, University of Anbar.

Electronic Computer Center

Ali Al-kubaisi , University of Anbar

Computer Sciences and Information Technology

Ahmed Majid Taha, University of Information Technology and Communications

College of Biomedical Informatics

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Published

2026-06-03

How to Cite

Suliman Farhan, A., Al-kubaisi , A., & Majid Taha, A. (2026). Lightweight CNN-Based Framework for Industrial Surface Defect Classification. Iraqi Journal for Computers and Informatics, 52(1), 278–289. https://doi.org/10.25195/ijci.v52i1.769